Process Modeling

Bringing Advanced Semiconductor Manufacturing Technologies to Higher Education

By: Jimmy Gu, Ph.D., Semiconductor Process & Integration Engineer, Coventor

Campus image for November 2016 blog

Universities and other institutions of higher learning play a key role in developing our next generation of semiconductor technologies. Along with the theory of semiconductor technology, our next generation of scientists and engineers must learn about the practical methods used to design and manufacture the latest generation of semiconductor products. read more…

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Achieving the Vision of Silicon Photonics Processing

By: Sandy Wen, MSEE, Semiconductor Process and Integration Engineer, Coventor

Silicon Photonics Test Die

Silicon Photonics Test Die

With the increasing need for faster data transfer rates, the transition from electrical to optical signaling in data processing is inevitable.   Copper cabling cannot keep up with the upcoming data center bandwidth requirements, for applications such as multimedia streaming and high performance computing.  One technology that could enable true optical communication is silicon photonics. read more…

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Design Process Technology Co-Optimization for Manufacturability

By:   Dalong Zhao – Semiconductor Process & Integration Engineering

Yield and cost have always been critical factors for both manufacturers and designers of semiconductor products.   Meeting yield and product cost targets is a continuous challenge, due to new device structures and increasingly complex process innovations introduced to achieve improved product performance at each new technology node.  Design for manufacturability (DFM) and design process technology co-optimization (DTCO) are widely used techniques that can ensure the successful delivery of both new processes and products in semiconductor manufacturing.   In this article, we will discuss how 3D (3 dimensional) DTCO can be used to improve product yield and accelerate product delivery dates in semiconductor manufacturing. read more…

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Coventor Announces SEMulator3D 6.0 and New Electrical Analysis Capabilities

Coventor’s Virtual Fabrication Platform Addresses Increasingly Complex Semiconductor Process Design Challenges

CARY, NC– June 6, 2016 – Coventor®, Inc., the leading supplier of automated software solutions for semiconductor devices and micro-electromechanical systems (MEMS), today announced the availability of SEMulator3D® 6.0 – the latest version of its semiconductor virtual fabrication platform. This new version further increases the accuracy of the process simulation, geometry and modeling of advanced semiconductor processes with new features, usability enhancements and a new add-on capability for electrical analysis. Along with SEMulator3D 6.0, Coventor is releasing an all-new SEMulator3D Electrical Analysis add-on component that allows seamless resistance and capacitance extraction directly from SEMulator3D process-predictive 3D models. read more…

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Will directed self-assembly pattern 14nm DRAM?

By: Mattan Kamon, PhD., Distinguished Technologist, R&D, Coventor

Matt's March 2016 Blog Graphic

But first, more generally, will directed self-assembly (DSA) join Extreme Ultraviolet (EUV) Lithography and next generation multi-patterning techniques to pattern the next memory and logic technologies?  Appealing to the wisdom of crowds, the organizers of the 2015 1st International DSA symposium recently surveyed the attendees, and nearly 75% believed DSA would insert into high volume manufacturing within the next 5 years, and nearly 30% predicted insertion within the next 2 years.   What is gating insertion?  The crowd rated defectivity as the most critical issue facing DSA.  This fact adds weight to memory being the first to be patterned with DSA.  This is because, as Roel Gronheid from IMEC pointed out last month at the SPIE Advanced Lithography conference [1], memory chips can tolerate single failing cells through redundancy and so can could tolerate higher defectivity in patterning (roughly 1 defect/cm2 compared to 0.01 defect/cm2 for logic).  Defectivity rates for DSA aren’t there yet (according to public information), but are rapidly approaching [2], [3]. read more…

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Directed self assembly may offer similar benefits to EUV, process modeling study says

By Luke Collins, Tech Design Forum

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Directed self assembly (DSA) techniques may offer similar advantages in terms of process variation control as EUV lithography, according to a study carried out using 3D behavioral process modeling techniques.

This could reduce fab cycle times, ease process integration and save costs in advanced semiconductor processes, especially for DRAMs, whose regular structures are well-suited to the use of DSA.

read the full article here

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Coventor ASML IMEC: The last half nanometer

By Scotten Jones, SemiWiki
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On Tuesday evening December 8th at IEDM, Coventor held a panel discussion entitled the “The Last Half Nanometer”. Coventor is a leading provider of simulation software used to design processes. This is my third year attending the Coventor panel discussion at IEDM and they are always excellent with very strong panels and discussion. The panel was made up of David Fried CTO of Coventor, Alek Chen from ASML, Aaron Theon of IMEC, and Subramanian Iyer from UCLA. Subramanian acted as both a panelist and the moderator.

read the full article here

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Asymmetric variability issues could impact 7nm processes

By Luke Collins, Tech Design Forum

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New variability issues highlighted by a massive process simulation exercise could make it more difficult than expected to achieve the performance advantages of emerging 7nm and 5nm processes.

Nano-electronics research centre imec has worked with Coventor to simulate the process variability of its 7nm BEOL fabrication processes using Coventor’s SEMulator3D virtual fabrication platform. The simulation of a full process window, looking at how multiple parameters of multiple processes interact, would have taken one million wafers to complete using conventional methods.

read the full article here

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