virtual fabrication

Semiconductor Process Development: Finding a Faster Way to Profitability

By: Katherine Gambino, Strategic Accounts Manager

Intel Fab

Building a chip fabrication facility requires billions of dollars in investment for land, buildings, processing equipment, chemical and hazardous material safety, not to mention the deployment of hundreds of highly experienced process engineering and manufacturing personnel. Bringing up an advanced semiconductor process in any fab, new or established, is a several-hundred-million dollar effort, typically requiring two or more years of experimentation with process equipment and process recipes, led by engineers with years of process integration and chip manufacturing expertise.

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Coventor Unveils New Scientific Findings on Lithography Processing For Improved Semiconductor Scalability and Performance

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At SPIE Advanced Lithography 2017, Coventor Will Present Results of Studies to Increase Density and Yield of Next-Generation Semiconductor Devices

CARY, NC– February 13, 2017 – Coventor®, Inc., the leading supplier of virtual fabrication solutions for semiconductor devices and micro-electromechanical systems (MEMS), will present findings from its research on advanced semiconductor fabrication processes at SPIE Advanced Lithography 2017. The results of these studies provide insight into techniques for advancing the state-of-the-art in semiconductor technology through use of new and emerging photomask, lithography and process technologies. read more…

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Bringing Advanced Semiconductor Manufacturing Technologies to Higher Education

By: Jimmy Gu, Ph.D., Semiconductor Process & Integration Engineer, Coventor

Campus image for November 2016 blog

Universities and other institutions of higher learning play a key role in developing our next generation of semiconductor technologies. Along with the theory of semiconductor technology, our next generation of scientists and engineers must learn about the practical methods used to design and manufacture the latest generation of semiconductor products. read more…

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IMEC Partner Technical Week Review

IMEC Partner Technical Week Review

By:   Aurélie Juncker, Semiconductor Process & Integration Engineer

a.Fully aligned Via with Cu recess approach - Gayle Murdoch, b. STT-RAM - Davide Crotti, c. N10 Supernova2 process - Matt Gallagher

a. Fully aligned Via with Cu recess approach – Gayle Murdoch, b. STT-RAM – Davide Crotti, c. N10 Supernova2 process – Matt Gallagher

In March 2016, Coventor was invited to the biannual Partner Technical Week (PTW) at IMEC in Leuven, Belgium. IMEC, a world-leading research group in nanotechnology, organizes their Partner Technical Week every 6 months to present scientific results to their partners. During this week, a number of specialists from IMEC’s many partner companies also discuss their progress in areas related to IMEC’s research. This event brings together a large number of engineers who are specialists in their domain, and provides an interesting forum to leverage the scientific knowledge gained by IMEC and its partners. read more…

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Will directed self-assembly pattern 14nm DRAM?

By: Mattan Kamon, PhD., Distinguished Technologist, R&D, Coventor

Matt's March 2016 Blog Graphic

But first, more generally, will directed self-assembly (DSA) join Extreme Ultraviolet (EUV) Lithography and next generation multi-patterning techniques to pattern the next memory and logic technologies?  Appealing to the wisdom of crowds, the organizers of the 2015 1st International DSA symposium recently surveyed the attendees, and nearly 75% believed DSA would insert into high volume manufacturing within the next 5 years, and nearly 30% predicted insertion within the next 2 years.   What is gating insertion?  The crowd rated defectivity as the most critical issue facing DSA.  This fact adds weight to memory being the first to be patterned with DSA.  This is because, as Roel Gronheid from IMEC pointed out last month at the SPIE Advanced Lithography conference [1], memory chips can tolerate single failing cells through redundancy and so can could tolerate higher defectivity in patterning (roughly 1 defect/cm2 compared to 0.01 defect/cm2 for logic).  Defectivity rates for DSA aren’t there yet (according to public information), but are rapidly approaching [2], [3]. read more…

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