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Solving process modeling, design automation, and integration challenges for the semiconductor and MEMS industries.

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March 21st 2018

Improving Patterning Yield at the 5 nm Semiconductor Node

By:  Benjamin Vincent, Ph.D., Staff Engineer, Semiconductor Process & Integration Engineering decisions are always data-driven.  As scientists, we only believe in facts and not in intuition or feelings. At the manufacturing stage, the semiconductor industry is eager to provide data...

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