September 19, 2017
FinFET Process Step Illustration

Using Advanced Statistical Analysis to improve FinFET transistor performance

Trial and error wafer fabrication is commonly used to study the effect of process changes in the development of FinFET and other advanced semiconductor technologies. Due to the interaction of upstream […]
November 16, 2016

Bringing Advanced Semiconductor Manufacturing Technologies to Higher Education

Universities and other institutions of higher learning play a key role in developing our next generation of semiconductor technologies. Along with the theory of semiconductor technology, our next generation of […]
January 28, 2016

Advanced Lithography and Process Variation Modeling Using SEMulator3D

One of the top and probably toughest challenges that process integrators are facing today in a silicon fab is process variability. As a former process integrator working hard to ramp […]
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