March 8, 2021
Figure 2: Description of the five modules required to build a SSVT-SRAM architecture
Published by Benjamin Vincent at March 8, 2021
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Overcoming Design and Process Challenges in Next-Generation SRAM Cell Architectures

Static Random-Access Memory (SRAM) has been a key element for logic circuitry since the early age of the semiconductor industry. The SRAM cell usually consists of six transistors connected to […]
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April 17, 2020
Fig.1. Bin illustration (a) Pass, (b) HR, (c) VML, (d) MML, (e) VMO, (f) VMS.
Published by QingPeng Wang at April 17, 2020
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Identifying and Preventing Process Failures at 7nm

Using failure bin classification, yield prediction and process window optimization to predict and enhance yield Device yield is highly dependent upon proper process targeting and variation control of fabrication steps, […]
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