By: Michael Hargrove, SP&I Engineer
Three years ago, I wrote a blog entitled “Linking Virtual Wafer Fabrication Modeling with Device-level TCAD Simulation” in which I described the seamless connection between the SEMulator3D® virtual wafer fabrication software platform and external 3rd party TCAD software. I’m now happy to report that device-level I-V performance analysis is now a built-in module within the SEMulator3D software platform. Users are no longer required to export a mesh and import it into a TCAD platform, when performing transistor I-V simulation. Now, once the 3D device structure is built in SEMulator3D, transistor I-V simulation can be performed directly within SEMulator3D without need for 3rd party solvers. Contacts and bias can be applied using the SEMulator3D device design, and I-V transistor characteristics can be determined for specific steps in the process flow. You can perform direct transistor-level performance evaluation inside the SEMulator3D software platform, without needing to export or import meshes. read more…
