• A Study of Wiggling AA Modeling and its Impact on Device Performance in Advanced DRAM

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  A Study of Wiggling AA Modeling and its Impact on Device Performance in Advanced DRAM

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• A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates

  Read more - A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates

  

  A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates

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• A million wafer, virtual fabrication approach to determine process capability requirements for an industry-standard N5 BEOL two-level metal flow

  Read more - A million wafer, virtual fabrication approach to determine process capability requirements for an industry-standard N5 BEOL two-level metal flow

  

  A million wafer, virtual fabrication approach to determine process capability requirements for an industry-standard N5 BEOL two-level metal flow

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• Defect Evolution in Next Generation, Extreme Ultraviolet Lithography

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  Defect Evolution in Next Generation, Extreme Ultraviolet Lithography

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• 3D NAND Flash Processing

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  3D NAND Flash Processing

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