Defect Analysis Archives - Coventor

A Study of Wiggling AA Modeling and its Impact on Device Performance in Advanced DRAM
Read more - A Study of Wiggling AA Modeling and its Impact on Device Performance in Advanced DRAM
A Study of Wiggling AA Modeling and its Impact on Device Performance in Advanced DRAM
A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates
Read more - A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates
A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates
A million wafer, virtual fabrication approach to determine process capability requirements for an industry-standard N5 BEOL two-level metal flow
Read more - A million wafer, virtual fabrication approach to determine process capability requirements for an industry-standard N5 BEOL two-level metal flow
A million wafer, virtual fabrication approach to determine process capability requirements for an industry-standard N5 BEOL two-level metal flow
Defect Evolution in Next Generation, Extreme Ultraviolet Lithography
Read more - Defect Evolution in Next Generation, Extreme Ultraviolet Lithography
Defect Evolution in Next Generation, Extreme Ultraviolet Lithography
3D NAND Flash Processing
Read more - 3D NAND Flash Processing
3D NAND Flash Processing