• Pathfinding by process window modeling: Advanced DRAM capacitor patterning process window evaluation using virtual fabrication

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  Pathfinding by process window modeling: Advanced DRAM capacitor patterning process window evaluation using virtual fabrication

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• A Study of the Impact of Line Edge Roughness on Metal Line Resistance using Virtual Fabrication

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  A Study of the Impact of Line Edge Roughness on Metal Line Resistance using Virtual Fabrication

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• Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle

  Read more - Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle

  

  Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle

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• Process Window Optimization of DRAM by Virtual Fabrication

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  Process Window Optimization of DRAM by Virtual Fabrication

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• Process Model Calibration: The Key to Building Predictive and Accurate 3D Process Models

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  Process Model Calibration: The Key to Building Predictive and Accurate 3D Process Models

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• A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options done by Virtual Fabrication

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  A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options done by Virtual Fabrication

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• A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates

  Read more - A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates

  

  A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates

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• Speeding Up Process Optimization with Virtual Processing

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  Speeding Up Process Optimization with Virtual Processing

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