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Process Window Optimization
Pathfinding by process window modeling: Advanced DRAM capacitor patterning process window evaluation using virtual fabrication
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- Pathfinding by process window modeling: Advanced DRAM capacitor patterning process window evaluation using virtual fabrication
Pathfinding by process window modeling: Advanced DRAM capacitor patterning process window evaluation using virtual fabrication
A Study of the Impact of Line Edge Roughness on Metal Line Resistance using Virtual Fabrication
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- A Study of the Impact of Line Edge Roughness on Metal Line Resistance using Virtual Fabrication
A Study of the Impact of Line Edge Roughness on Metal Line Resistance using Virtual Fabrication
Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle
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- Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle
Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle
Process Window Optimization of DRAM by Virtual Fabrication
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- Process Window Optimization of DRAM by Virtual Fabrication
Process Window Optimization of DRAM by Virtual Fabrication
Process Model Calibration: The Key to Building Predictive and Accurate 3D Process Models
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- Process Model Calibration: The Key to Building Predictive and Accurate 3D Process Models
Process Model Calibration: The Key to Building Predictive and Accurate 3D Process Models
A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options done by Virtual Fabrication
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- A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options done by Virtual Fabrication
A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options done by Virtual Fabrication
A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates
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- A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates
A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options: Comparing Bulk vs. SOI vs. DSOI Starting Substrates
Speeding Up Process Optimization with Virtual Processing
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- Speeding Up Process Optimization with Virtual Processing
Speeding Up Process Optimization with Virtual Processing
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