• Evaluating MEMS Device Virtual Metrology & DRIE

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  Evaluating MEMS Device Virtual Metrology & DRIE

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• 22nm Technology Yield Optimization Using Multivariate 3D Virtual Fabrication

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  22nm Technology Yield Optimization Using Multivariate 3D Virtual Fabrication

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• Back-End-of-Line (BEOL) Metallization

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  Back-End-of-Line (BEOL) Metallization

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• Back-End-of-Line (BEOL) Virtual Patterning

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  Back-End-of-Line (BEOL) Virtual Patterning

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• FinFET Front End of Line FEOL Process Integration

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  FinFET Front End of Line FEOL Process Integration

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