SEMulator3D Archives | Coventor

SVT (six stacked vertical transistors) SRAM cell architecture introduction: design and process challenges assessment
Read more
SVT (six stacked vertical transistors) SRAM cell architecture introduction: design and process challenges assessment
A Triple-Deck CFET Structure with an Integrated SRAM Cell for the 2nm Technology Node and Beyond
Read more
A Triple-Deck CFET Structure with an Integrated SRAM Cell for the 2nm Technology Node and Beyond
Evaluation of the impact of source drain epi implementation on logic performance using combined process and circuit simulation
Read more
Evaluation of the impact of source drain epi implementation on logic performance using combined process and circuit simulation
Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle
Read more
Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle
Process Window Optimization of DRAM by Virtual Fabrication
Read more
Process Window Optimization of DRAM by Virtual Fabrication
A Study of Wiggling AA Modeling and its Impact on Device Performance in Advanced DRAM
Read more
A Study of Wiggling AA Modeling and its Impact on Device Performance in Advanced DRAM
Process Model Calibration: The Key to Building Predictive and Accurate 3D Process Models
Read more
Process Model Calibration: The Key to Building Predictive and Accurate 3D Process Models
A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options done by Virtual Fabrication
Read more
A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options done by Virtual Fabrication
Impact of EUV Resist Thickness on Local Critical Dimension Uniformities for <30 nm CD Via Patterning
Read more
Impact of EUV Resist Thickness on Local Critical Dimension Uniformities for <30 nm CD Via Patterning