April 12, 2017Published by Mustafa Akbulut at April 12, 2017Categories Coventor BlogPhotoresist shape in 3D: Understanding how small variations in photoresist shape significantly impact multi-patterning yieldThings were easy for integrators when the pattern they had on the mask ended up being the pattern they wanted on the chip. Multi-patterning schemes such as Self-Aligned Double Patterning […]